EPMA (Electron probe microanalysis)

Equipment

    Cameca SX 100 with WDS and EDS including instrumentation to record SE and BSE images     Configuration:
    Excitation: 40kV / W-Filament
    Spectrometer: 4xvertikal (WD) and PGT-detector (ED/N2 cooling)
    Counter : 4xAr/Me flow counter (WD) / Si(Li) semiconductor (ED, N2-cooling, resolution 138 eV)     Optics (WD):
                     TAP, PET, PC1, PC2 (extended Theta range for OKa on TLAP)
                     LiF, PET (exchangeable detector slit for increased spectral resolution)
                     LLiF, LPET (large cristals)
                     TAP, PC0, PC1, PC3 ()
    Element range: Be (PC3) - U (LIF)
    Optical microscope: Reflected/transmitted with mit polarizer and CCD camera; magnification
    400 (fixed)
    Instrument software: Peak-Sight (PC / Win2000); IdFix (ED measurement / interpretation)     Cameca SX Five with WDS and EDS including instrumentation to record SE and BSE images     Configuration:
    Excitation: 30kV / Field emission
    Spectrometer: 5xvertical (WD) and Bruker-EDS (Peltier cooling)
    Counter : 5xAr/Me flow counter (WD) / SDD semiconductor (ED, Peltier cooling resolution 138 eV)
    Optics (WD):
                     LTAP, LPC1 (extended Theta range for OKa on TLAP)
                     LiF, TAP,PC0,PC1
                     LLiF, LPET (large cristals)
                     TAP, PC0, PC1, PCX()
                     LLIF, LPET (large crystals)
    Element range: Be (PC3) - U (LIF)
    Optical microscope: Reflected/transmitted with mit polarizer and CCD camera; magnification
    varaible 150 - 1700┬Ám
    Instrument software: Peak-Sight (PC / Win7); Quantax (ED measurement / interpretation)     MinIdent (Prof. Dorian G.W. Smith / David Peirre Leibovitz; mineral identification with ESMA analysis)     Sample preparation: Bal-Tec MED 020 (coating with C, Ag, Au, etc)     

Applications

  Qualitative and quantitative element analysis (minerals, rocks, technical products)    Elements depend on application and matrix
  Topography / element mapping (minerals, rocks, technical products)
  An extensive selection of international reference materials is available for calibration of most   applications for geo and material sciences.

Contact persons

    Klaus Herrmann     Dietlind Nordhausen     Dr. Thomas Schirmer
 

Contact  Search  Sitemap  Datenschutz  Imprint
© TU Clausthal 2017